跳到主要导航 跳到搜索 跳到主要内容

Leakage current as a predictor of failure in dielectric elastomer actuators

  • T. A. Gisby
  • , S. Q. Xie
  • , E. P. Calius
  • , I. A. Anderson

科研成果: 书/报告/会议事项章节会议稿件同行评审

56 引用 (Scopus)

摘要

Dielectric breakdown often leads to catastrophic failure in Dielectric Elastomer Actuator(s) (DEA). The resultant damage to the dielectric membrane renders the DEA useless for future actuation, and in extreme cases the sudden discharge of energy during breakdown can present a serious fire risk. The breakdown strength of DEA however is heavily dependent on the presence of microscopic defects in the membrane giving its overall breakdown strength inherent variability. The practical consequence is that DEA normally have to be operated far below their maximum performance in order to achieve consistent reliability. Predicting when DEA are about to suffer breakdown based on feedback will enable significant increase in effective DEA performance without sacrificing reliability. It has been previously suggested that changes in the leakage current can be a harbinger of dielectric breakdown; leakage current exhibits a sharp increase during breakdown. In this paper the relationship between electric field and leakage current is investigated for simple VHB4905-based DEA. Particular emphasis is placed on the behaviour of leakage current leading up to and during breakdown conditions. For a sample size of nine expanding dot DEA, the DEA that failed at electric fields below the maximum tested exhibited noticeably higher nominal power dissipation and a higher frequency of partial discharge events than the DEA that did not breakdown during testing. This effect could easily be seen at electric fields well below that at which the worst performing DEA failed.

源语言英语
主期刊名Electroactive Polymer Actuators and Devices (EAPAD) 2010
DOI
出版状态已出版 - 2010
已对外发布
活动Electroactive Polymer Actuators and Devices (EAPAD) 2010 - San Diego, CA, 美国
期限: 8 3月 201011 3月 2010

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
7642
ISSN(印刷版)0277-786X

会议

会议Electroactive Polymer Actuators and Devices (EAPAD) 2010
国家/地区美国
San Diego, CA
时期8/03/1011/03/10

指纹图谱

探究 'Leakage current as a predictor of failure in dielectric elastomer actuators' 的科研主题。它们共同构成独一无二的指纹。

引用此